SANDEEP AKINEPALLI. THE FUTURE OF AI-DRIVEN TEST AUTOMATION. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY (IJCET), [S. l.], v. 15, n. 6, p. 291–299, 2024. Disponível em: https://mylib.in/index.php/IJCET/article/view/IJCET_15_06_024.. Acesso em: 14 mar. 2025.