HALL EFFECT OF CDS THIN FILMS BY VACUUM EVAPORATION DEPOSITION

Authors

  • D KATHIRVEL Department of Physics, Kalaignar Karunanidhi Institute of Technology, Coimbatore, India. Author
  • N SURIYANARAYANAN Department of Physics, Government College of Technology, Coimbatore, India. Author
  • S PRABAHAR Department of Physics, Tamilnadu College of Engineering, Coimbatore, India. Author
  • S SRIKANTH Department of Physics, Tamilnadu College of Engineering, Coimbatore, India. Author

Keywords:

CdS Thin Film, Electrical Resistivity, Vacuum Evaporation, Hall Effect

Abstract

Cadmium Sulfide thin films have been deposited on to well cleaned glass substrate in a vacuum of 10-6 Torr. The thickness of the films has been determined by quartz crystal monitor method. The Hall Effect and the electrical resistivity have been and continue to be the key parameters used in the investigations of the basic electrical conduction processes in semiconductor materials.

 

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Published

2019-05-14

Issue

Vol. 2 No. 1 (2019): INTERNATIONAL JOURNAL OF PHYSICS RESEARCH AND DEVELOPMENT (IJPRD)

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Articles

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Copyright (c) 2019 D KATHIRVEL, N SURIYANARAYANAN, S PRABAHAR, S SRIKANTH (Author)

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This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

How to Cite

HALL EFFECT OF CDS THIN FILMS BY VACUUM EVAPORATION DEPOSITION. (2019). INTERNATIONAL JOURNAL OF PHYSICS RESEARCH AND DEVELOPMENT (IJPRD), 2(1), 35-42. https://mylib.in/index.php/IJPRD/article/view/IJPRD_01_01_005